International Society for Industrial Process Tomography

A Multi-Frequency Imaging Strategy for Capacitively Coupled Electrical Impedance Tomography (CCEIT)

Y. D. Jiang^1*, J. C. Huang¹, B. L. Wang¹, H. F. Ji¹, Z. Y. Huang¹, M. Soleimani²

¹State Key Laboratory of Industrial Control Technology, College of Control Science and Engineering, Zhejiang University, Hangzhou, 310027, China

²Engineering Tomography Laboratory (ETL), Department of Electronic and Electrical Engineering, University of Bath, Bath, BA2 7AY, UK

^*Email: ydjiang@zju.edu.cn

Short paper - no abstract

Keywords: electrical impedance tomography (EIT), capacitively coupled electrical impedance tomography (CCEIT), image reconstruction, multi-frequency (MF) measurement

Industrial Application: General