Register or Log In

International Society for Industrial Process Tomography

10th World Congress on Industrial Process Tomography

A Multi-Frequency Imaging Strategy for Capacitively Coupled Electrical Impedance Tomography (CCEIT)

Y. D. Jiang1*, J. C. Huang1, B. L. Wang1, H. F. Ji1, Z. Y. Huang1, M. Soleimani2

1State Key Laboratory of Industrial Control Technology, College of Control Science and Engineering, Zhejiang University, Hangzhou, 310027, China

2Engineering Tomography Laboratory (ETL), Department of Electronic and Electrical Engineering, University of Bath, Bath, BA2 7AY, UK

*Email: ydjiang@zju.edu.cn


Short paper - no abstract


Keywords: electrical impedance tomography (EIT), capacitively coupled electrical impedance tomography (CCEIT), image reconstruction, multi-frequency (MF) measurement

Industrial Application: General

Sign-in to access the full text