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International Society for Industrial Process Tomography

10th World Congress on Industrial Process Tomography

Conductivity Prediction of Complex-Valued Multi-Frequency Electrical Capacitance Tomography Based on Deep Neural Network

Liying Zhu, Maomao Zhang*, Zhiyuan Chen, Yi Li

Tsinghua Shenzhen International Graduate School, Shenzhen, China.


Short paper - no abstract

Keywords: Complex-valued Capacitance Measurement, Electrical Capacitance Tomography, Multiple Frequency Measurement, conductivity measurement;

Industrial Application: General

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