A High Speed, Multi-Frequency Impedance Analysing Node

Stephen J Dickinson1, Anthony J Peyton2

1,2 Lancaster University - Engineering department, Lancaster University, Lancaster LA1 4YR

1 s.dickinson@lancs.ac.uk

2 a.peyton@lancs.ac.uk

ABSTRACT

In electrical tomography, the process materials may display frequency dependant properties, presenting the opportunity to exploit spectroscopy in order to identify particular components, determine specific parameters or monitor internal conditions. Multiple frequency excitation offers obvious speed advantages over the swept frequency alternative. In addition, the excitation waveform can be tailored to the particular requirements of the application. This paper will describe the development of a multiple frequency impedance measuring node which demonstrates the technique.

Keywords Electromagnetic, multivariate, multi-frequency, electrical tomography, DSP.