2nd World Congress on Industrial Process Tomography
Towards the Development of a Multiple-Frequency ECT System
D.Georgakopoulos, R.C.Waterfall and W.Q.Yang
Dept. of Electrical Engineering and Electronics, UMIST, PO Box 88 Sackville Street, Manchester M60 1QD, UK
dimitrios.georgakopoulos@stud.umist.ac.uk, waterfall@umist.ac.uk, w.yang@umist.ac.uk
ABSTRACT
Electrical capacitance tomography (ECT) is a technique to visualise processes containing contrasting dielectric components. Our existing ECT system employs a single excitation frequency, but a new system under development at UMIST will enable scanning across the range of 10 kHz to 1 MHz, facilitating spectroscopic measurements. The system will be able to resolve the real and the imaginary parts of impedance, i.e. to operate as a dual-modality system. This paper presents the design ideas and some preliminary results.
Keywords Spectroscopy, Capacitance measurement, Tomography
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