A Novel Capacitance Measurement Circuit for Electrical Capacitance Tomography*

Baoliang WANG, Zhiyao HUANG, Haiqing LI

Department of Control Science and Engineering, Zhejiang University, Hangzhou 310027, P. R. China, E-mail: blwang@iipc.zju.edu.cn

ABSTRACT

A new capacitance measuring circuit based on the charge amplification principle for electrical capacitance tomography has been developed. The measured capacitance is only charged and discharged once and no noise is created by the measurement principle. Test results show the data acquisition time for 66 capacitance measurements (for reconstructing one image) is 4.2ms and the time for transmitting the data is 2ms.

Keywords Tomography, Capacitance, Measurement, Circuit.