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International Society for Industrial Process Tomography

2nd World Congress on Industrial Process Tomography

Influence of Unsharpness on Crack Length Evaluation with Computerized Tomography Methods

A.V.Likhachov2, V.V.Pickalov2, U.Ewert1, B.Redmer1 1BAM, Berlin, Germany

2Institute of Theoretical and Applied Mechanics SB RAS, Institutskaya Str. 4/1, Novosibirsk 630090,

Russia, likhache@itam.nsc.ru


ABSTRACT


The problem of crack inspection in solids with X-ray tomography methods is treated. The degradation of projection data under limited angle conditions is found to result in crack length overestimation (crack overshoot). The latter was revealed both by numerical simulations and real measurements. Deconvolution of available projection data was suggested as a method to improve reconstruction quality. Several methods for determining the unknown blurring kernel were proposed. Numerical simulations were carried out.


Keywords crack inspection, X-ray tomography, crack overshoot


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