International Society for Industrial Process Tomography

High-resolution X-ray computed tomography of low-contrast samples with the use of synchrotron radiation

Kuper K.E.1, Zarko V.E.2, Kvasov A.A.2,Ten K.A.3, Pruuel E.R.3

1. Budker Institute of Nuclear Physics SB RAS, Novosibirsk, 630090, Russia

2. Institute of Chemical Kinetics and Combustion SB RAS, Novosibirsk, 630090, Russia

3. Lavrentyev Institute of Hydrodynamics SB RAS, Novosibirsk, 630090, Russia

   
   

   ABSTRACT

   
   

   High-resolution X-ray computed tomography (HRXCT) is a promising technology for characterization of energetic materials. In the present study HRXCT was applied to low-contrast samples with the use of synchrotron radiation (SR) from the VEPP-3 storage ring (Novosibirsk, Russia) at the station «X-ray microscopy and tomography». Comparative analysis of 3D internal structure was carried out for different high explosives and solid fuel samples. The void morphology, total porosity and pores size distribution have been measured for different crystal and polymer substances.

   In order to efficiently increase the spatial resolution of the method the X-ray magnification system (Bragg magnifier) was used [1,2]. The Bragg magnifier is based on diffraction from an asymmetrically cut crystal. Bragg diffraction from an asymmetrically cut crystal produces one- dimensional magnification. Two asymmetrically cut crystals reflecting in mutually perpendicular directions gave a uniform two-dimension magnification. The use of Bragg magnifier with a magnification factor of 25 allows achievement of 2-3 µm spatial resolution.

   The Bragg magnifier works as angle analyzer for transmitted beam, which enhances the

   refraction contrast similar to that in diffraction enhanced imaging (DEI) technique. This gives a possibility to visualize low-contrast details in recorded images.

   
   

   Keywords Bragg magnifier, X-ray tomography, microinclusions.