6th World Congress on Industrial Process Tomography
Compensating for Motion Artefacts in X-Ray CT Using Ellectrical Imepdance Tomography Data
Thanyawee Pengpan, Cathryn N. Mitchell, Manuchehr Soleimani
Electronic and Electrical Engineering, University of Bath, Bath, BA2 7AY UK,
M. Soleimani@bath.ac.uk
ABSTRACT
Xray CT is a powerful imaging tool that is very well established for a range of applications; including industrial process tomography related applications. The Xray CT is belonging to so called hard field imaging which generally provides high spatial resolution imaging. On the other hand electrical impedance tomography (EIT) from family of so called soft field tomography is a technique able to provide images with high temporal resolution. This paper present a dual modality EIT and X ray CT, in which EIT is used as a motion compensation tool for the XRay CT to account for relatively low temporal resolution of the CT. Simulation study shows that the combined soft and hard field tomography can reduce the effect of the motion artefacts.
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