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International Society for Industrial Process Tomography

7th World Congress on Industrial Process Tomography

Volumetric soft field and hard field tomography: MIT, ECT, EIT, cone beam CT

Z. Yea, C. L. Yanga, L. Maa, H. Y. Weia, R. Banasiakb, M. Soleimania

aDepartment of Electronic and Electrical Engineering, University of Bath, Bath, BA2 7AY, UK

bInstitute of Applied Computer Science, Lodz University of Technology, Poland


In this paper volumetric imaging results will be presented for soft field tomography techniques such as electrical impedance tomography (EIT), electrical capacitance tomography (ECT) and magnetic induction tomography (MIT). Volumetric imaging results are also shown in hard field tomography in cone beam X-ray CT. The forward problem in soft field electromagnetic tomography is governed by various approximations of the Maxwell?s questions; the Jacobian matrix is then established to solve the inverse problem. The forward model in cone beam CT is based on intersection of straight lines between source and detectors and 3D voxels. A parallel conjugate gradient method is used to solve each of the inverse algorithms in all above imaging system.

Keywords: Magnetic induction tomography, Electrical capacitance tomography, electrical impedance tomography, Cone beam X-ray CT

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