Efficient numerical approach for the calculation of sensitivity maps of MIT based on Finite Elements and Perturbation Method in Low Conductive Materials

W. Yin, Y. Zhao, A. Peyton

School of Electrical and Electronic Engineering, University of Manchester, Sackville Street Building, Manchester M13 9PL, United Kingdom

Abstract

The efficient calculation of the forward problem and the sensitivity maps is a difficult aspect of Magnetic induction tomography (MIT). For medical or process applications where the medium has low conductivity, a weakly coupled assumption can be made in the spectrum of 10 kHz ? 10 MHz and the problem simplifies to a scalar Laplace equation. The finite difference method (FDM) was used to solve the scalar equation, which may not produce accurate results on curved or irregular boundaries. In this paper, we developed a FEM solver which delivers higher accuracy with reduced computation load and efficiently calculate the sensitivity map.

Keywords: sensitivity maps; finite element modelling; magnetic induction tomography; weakly coupled field approximation