Extraction of complex microstructural pattern in X-ray microtomography images: application to lamellar titanium alloy

L. Babout, Ł. Jopek, M. Janaszewski

Institute of Applied Computer Science, Lodz University of Technology, Stefanowskiego 18/22, Lodz 90-924, Poland

Abstract

This paper focuses on the presentation of the methodology used to extract from a lamellar microstructure the pattern corresponding to grain boundaries in X-ray microtomography images of (α+β) titanium alloy. Instead of presenting a new type of image processing, the method consists in the combination of well-known procedures and recent propositions from the authors. Indeed, the study shows that β grain boundaries can be satisfyingly separated from lamellar microstructure by combining mean shift, directional FIR filter and topological notions and methods such as thinning and hole closing.

Keywords: image processing; β grain boundary; X-ray microtomography; lamellar microstructure