Calculation of 3D sensitivity maps for MIT using boundary elements and the perturbation method

Q. Zhaoa, W. Yinb, A. Peytonb

aSchool of Electrical Engineering and Automation, Tianjin University, Tianjin 300072, China

bSchool of Electrical and Electronic Engineering, University of Manchester, M60 1QD, UK

Abstract

Magnetic induction tomography (MIT) is a non-destructive imaging technique able to map the passive electromagnetic properties of an object. When the driving frequency is significantly high, metallic targets can be treated as perfect electric conductors (PEC). Boundary Element Method (BEM) based on integral formulations becomes an effective way to analyse this kind of scattering problem. We computed 3-D sensitivity maps in a simple high frequency MIT system due to a PEC perturbation. The magnetic scalar potential is used to improve the efficiency. It has been confirmed that the sensitivity maps derived by BEM are in good agreement with the theoretical H dot H solution.

Keywords: Magnetic induction tomography; perfect electric conductor; boundary element method; 3-D sensitivity map