Sensitivity Analysis of 3D Magnetic Induction Tomography (MIT)

W R B Lionheart1, M Soleimani1, A J Peyton2

1 Department of Mathematics UMIST, Manchester, UK, Email: bill.lionheart@umist.ac.uk,

2 Department of Engineering University of Lancaster, Lancaster, UK, Email: a.peyton@lancaster.ac.uk

ABSTRACT

One of the major tools for both design and the image reconstruction of an MIT system are the spatial sensitivity analysis of the object space. This sensitivity analysis effectively maps the sensitivity of a particular excitation / detection coil pair to a small perturbation of the conductivity of the material in the object space. We derive a formula for the sensitivity of the measured voltage in terms of the magnetic vector potential A, which gives to an efficient method of sensitivity calculation using Finite Element Method.

Keywords Magnetic Induction Tomography, Sensitivity Analysis