5th World Congress on Industrial Process Tomography
nanoCT: Visualising of Internal 3D-Structures with Submicrometer Resolution
O. Brunke, A .Egbert and D. Neuber
phoenix|x-ray Systems + Services GmbH, Niels-Bohr-Str. 7, D-31515 Wunstorf, Germany, Email: obrunke@phoenix-xray.com, Tel.: +49 5031 172-142, www.phoenix-xray.com
ABSTRACT
High-resolution Computed Tomography (CT) widely expands the spectrum of detectable internal micro-structures. The new nanotom CT system allows the analysis of samples with the exceptional voxel-resolution of less than 0.5 microns per volume pixel (voxel). Thus internal detail related to a variation in material, density or porosity can be visualised and precisely measured. This opens a new dimension of 3D-microanalysis and will partially substitute traditional destructive methods in industrial quality control and research.
The nanotom® is the first 180 kV nanoCT system world-wide which is tailored specifically to the highest-resolution applications for process control in the mineral, metal or plastic manufacturing industry, as well as for the evaluation of the internal microstructure of pore networks in rock samples originated by drilling for oil or gas.
Several results of high-resolution nanoCT demonstrate the capability to analyse the 3D-microstructure of materials with only minimal sample preparation. For instance, it is possible to image different metal phases in solder joints, the texture of fibres in composites or the volume and distribution of voids in castings.
The volume data set is visualised by slices or compiled in a three-dimensional view which can be displayed in various ways. By means of volume visualisation software, the three-dimensional structure of the reconstructed volume can be easily analysed for pores, cracks and materials density and distribution with the highest magnification and image quality available.
By granting the user the ability to navigate the internal structure of an object slice-by-slice in a non- destructive manner, the nanotom creates new possibilities for analysis which have so far been unreachable.
Keywords nanoCT, Submicron Resolution, nanofocus Computed Tomography
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