Wideband Electrical Impedance Tomography Simulation Study

M. Nahvi and B. S. Hoyle

Institute of Integrated Information Systems, School of Electronic and Electrical Engineering, University of Leeds, UK, Emails: {eenmn, B.S.Hoyle}@leeds.ac.uk

ABSTRACT

The paper describes a simulation study of wideband electrical impedance tomography. The motivation for this study is that some process materials may show considerable change in their electrical properties in response to the injected signal over a wide frequency range. This concept is used in the paper to demonstrate the construction of tomography images for a range of frequency bands that can provide a deeper understanding and interpretation of a process under investigation. To provide measurements over a required frequency range a linear chirp was used as the excitation signal. Boundary measurements have been synthesised using a 2D model in association with the Eidors forward solver. The measurements are then demodulated using an algorithm based on the wavelet transform. The performance of the method is demonstrated in the paper through comparison between demodulated data and reconstructed images using the presented novel method and those simulated using a conventional single frequency approach. The described method can facilitate the measurement procedure for spectroscopic analysis, so that the amplitude spectrum of the process can be obtained.

Keywords Process spectroscopy, Wideband electrical impedance tomography, Wavelet analysis, Chirp waveform